tuesday, feb 26, 2008 3:39 pm / high speed, low power, operational amplifier ad847 asd0011318 rev. d information furnished by analog devices is believed to be accurate and reliable. however, no responsibility is assumed by analog devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. specifications subject to change without notice. no license is granted by implication or otherwise under any patent or patent rights of analog devices. trademarks and registered trademarks are the property of their respective companies. one technology way, p.o. box 9106, norwood, ma 02062-9106, u.s.a. tel: 781.329.4700 www.analog.com fax: 781.326.8703 ? 2008 analog devices, inc. all rights reserved. 1.0 scope this specification documents the detail requ irements for space qualifi ed product manufactured on analog devices, inc.'s qml certified line per mil- prf-38535 level v except as modified herein. the manufacturing flow described in the standard space level products program brochure is to be considered a part of this specification. http://www.analog.com/aerospace this data sheet specifically details the space grade version of this product. a more detailed operational description and a complete data shee t for commercial product grades can be found at www.analog.com/ad847 2.0 part number . the complete part number(s) of this specification follow: part number description ad847-703q high speed, low power, operational amplifier AD847-713Q radiation tested, high speed, low power, operational amplifier 2.1 case outline . letter descriptive designator case outline (lead finish per mil-prf-38535) q gdip1-t8 8-lead ceramic dual-in-line package (cerdip) figure 1 - terminal connections .
ad847 asd0011318 rev. d | page 2 of 5 3.0 absolute maximum ratings . (t a = 25c, unless otherwise noted) supply voltage ............................................................................................................ 18 v differential input voltage .............................................................................................. 6v input common mode voltage ......................................................................................... v s operating temperature range...................................................................... -55c to +125c storage temperature range ........................................................................ -65c to +150c power dissipation (p d ) ..................................................................................................1.1w lead temperature (soldering, 10 seconds) .............................................................. +300c thermal resistance, junction-to-case ( jc ) .......................................... see mil-std-1835 thermal resistance, junction-to-ambient ( ja ) .......................................... 110c/w junction temperature (t j ) ............................................................................ +175c 4.0 electrical table : see notes at end of table table i parameter symbol conditions 1/ sub- group 2/ min 2/ max units input offset voltage v io 1 1.0 mv 2, 3 4.0 input bias current i b v s = 5v, 15v 1 5.0 a 2, 3 7.5 input offset current i io 1 300 na 2, 3 400 common mode input voltage ivr 1, 2, 3 2.5 v range 3/ v s = 15v 1, 2, 3 12 open loop gain avo v out = 2.5v, r l = 500 1 2.0 v/mv 2, 3 1.0 v out =10v, r l =1k , v s =15v 1 3.0 2, 3 1.5 common mode rejection ratio cmrr v cm = 2.5v 1 80 db v cm = 12v, v s = 15v 1 80 2, 3 75 output current 4/ i out v out = 2.5v 4 13 ma v out = 10v, v s = 15v 4 20 output voltage swing +v out r l = 500 1 3.0 v 2, 3 2.5 r l = 150 1 2.5 v s = 15v, r l = 1k 1, 2, 3 12 v s = 15v, r l = 500 1 10 -v out r l = 500 1 -3.0 2, 3 -2.5 r l = 150 1 -2.5 v s = 15v, r l = 1k 1, 2, 3 -12 v s = 15v, r l = 500 1 -10 quiescent power supply current i cc 1 5.7 ma 2, 3 7.8 v s = 15v 1 6.3 2, 3 8.4 power supply rejection ratio psrr v s = 5v to 15v 1 75 db 2, 3 72 differential input resistance 4/ r in v s = 5v, 15v 4 80 k
ad847 asd0011318 rev. d | page 3 of 5 table i parameter symbol conditions 1/ sub- group 2/ min 2/ max units slew rate 6/ 4/ +sr v out = -2.5v to +2.5v, r l = 500 , a v =1v/v, 4 120 v/ s measured from 10% to 90% 5, 6 90 -sr v out = +2.5v to -2.5v, r l = 500 , a v =1v/v, 4 90 measured from 10% to 90% 5, 6 65 +sr v out = -5v to +5v, r l = 1k , v s = 15v 4 200 measured from 10% to 90% 5, 6 130 -sr v out = +5v to -5v, r l = 1k , v s = 15v 4 145 measured from 10% to 90% 5, 6 120 gain bandwidth product 4/ gbwp v out = 100mv, r l - 500 4 25 mhz v out = 100mv, r l = 1k , vs = 15v 40 full power bandwidth 4/ fpbw v pk = 2.5v, r l = 500 4 5.7 v pk = 10v, r l = 1k , v s = 15v 2.8 closed loop stable gain 4/ clsg r l = 1k , v s = 5v, 15v 4, 5, 6 1.0 v/v rise time 4/ 8/ r r v out = 0v to +200mv, a v = +1, r l =- 1k , v s = 15v 4, 5, 6 10 ns t f v out = 0v to -200mv, a v = +1, r l =- 1k , v s = 15v 4, 5, 6 10 settling time 4/ t s a v = -1v/v, 10v step at 0.1% of the fixed value, r l = 1k 150 a v = -1v/v, 10v step at 0.01% of the fixed value, r l = 1k 200 overshoot 4/ +os v out = 0v to +200mv, a v = +1, r l = 1k , v s = 15v 4 30 % -os v out = 0v to -200mv, a v = +1, r l = 1k , v s = 15v 4 30 table i notes: 1/ unless otherwise specified for dc tests, v s = 5v, r s < 100 , r l > 100k , v out = 0v, and c l 10pf. unless otherwise specified for ac tests, a v = 1 v/v, r l = 1k , and c l = 10pf. 2/ the limiting terms "min" (minimum) and "max" (maximum) shall be considered to apply to magnitudes only. negative current shall be defined as conventi onal current flow out of a device terminal. 3/ this parameter is guaranteed by cmrr test. 4/ if not tested, shall be guaranteed to th e limits specified in table i herein. 5/ quiescent power consumption is based on quiescent suppl y current test maximum (no load at the output). 6/ slew rate test limits are guarantee after 5 minutes of warm-up. 7/ full power bandwidth = sr/(2 v pk ). 8/ rise and fall times measured between 10% and 90% point.
ad847 asd0011318 rev. d | page 4 of 5 4.1 electrical test requirements : table ii test requirements subgroups (in accordance with mil-prf-38535, table iii) interim electrical parameters 1 final electrical parameters 1, 2, 3, 4, 5, 6 1/ 2/ group a test requirements 1, 2, 3, 4, 5, 6 group c end-point electric al parameters 1 2/ group d end-point electr ical parameters 1 group e end-point electr ical parameters 1 1/ pda applies to subgroup 1. delta's excluded from pda. 2/ see table iii for delta parameters. see table i for conditions. 4.2 table iii. burn-in test delta limits . table iii test burn-in lifetest delta title endpoint en dpoint limit units v os 1 1.5 0.5 mv i b 5 7.5 2.5 a i io 300 500 200 na 5.0 life test/burn-in circuit: 5.1 htrb is not applicable for this drawing. 5.2 burn-in is per mil-std-883 method 1015 test condition b. 5.3 steady state life test is per mil-std-883 method 1005.
ad847 asd0011318 rev. d | page 5 of 5 rev description of change date a initiate july 20, 2000 b update web address feb. 7, 2002 c update web address. delete burn-in circuit. june 20, 2003 d update header/footer & add to 1.0 scope description. feb. 25, 2008 ? 2008 analog devices, inc. all rights reserved. trademarks and registered trademarks are the property of their respective companies. printed in the u.s.a. 02/08
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